Experiment: Bragg Reflection (115 V, 50/60 Hz)

Experiment: Bragg Reflection (115 V, 50/60 Hz), 8000734 [UE7010100-115], Diffractrometry
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Objective: Determine the lattice constants for crystals with a structure similar to salt (NaCl)

Measurement of Bragg reflection is a key method for investigating monocrystals using X-rays. It involves X-rays being reflected by the various lattice planes, whereby the secondary waves reflected by individual layers undergo constructive interference when the Bragg condition is fulfilled. If the wavelength of the X-rays is known, it is possible to calculate the separation between lattice planes. In this experiment, various crystals which share the structure of salt (NaCl) are investigated and compared.

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X-Ray Apparatus (115 V, 50/60 Hz), 1000660 [U192001-US], X-Ray Physics

X-Ray Apparatus (115 V, 50/60 Hz)

1000660 [U192001-US]
Unit price
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Basic Set Bragg, 1008508 [U19212], X-Ray Physics

Basic Set Bragg

1008508 [U19212]
Unit price
$ 808.00
Crystallography Accessories, 1000666 [U19206], X-Ray Physics

Crystallography Accessories

1000666 [U19206]
Unit price
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Bragg Driver, 1012871 [U40207], X-Ray Physics

Bragg Driver

1012871 [U40207]
Unit price
$ 3,818.00
Item No.: 8000734 [UE7010100-115]
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